Xanthomonas translucens pv. undulosa strain:XtXJ-1 Genome sequencing. Xanthomonas translucens pv. undulosa strain:XtXJ-1

Xanthomonas translucens pv. undulosa causes bacterial leaf streak and black chaff on wheat, leading to severe yield and quality loss. Here, we isolated a strain XtXJ-1 from symptomatic wheat in China and identify it as pv. undulosa. After whole-genome sequence and assembly, a chromosome was generated and seven transcription-activator like effectors were observed. The genome data will contribute to understand the geographic adaption and provide information for the discovery of new virulence effectors.