[AFM] 250nm Sawtooth Si substrate - Magnetization reversal mechanisms in highly corrugated thin films
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https://zenodo.org/record/14770888
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资源简介：
AFM characterization (raw and processed images and profile data) of ST Si wafers. It shows 250nm lateral periodicity and roughly 160nm in ripple amplitude.
创建时间：
2025-01-30
