[AFM] 250nm Sawtooth Si substrate - Magnetization reversal mechanisms in highly corrugated thin films
收藏NIAID Data Ecosystem2026-05-02 收录
数据链接：
官方服务：
资源简介：
AFM characterization (raw and processed images and profile data) of ST Si wafers. It shows 250nm lateral periodicity and roughly 160nm in ripple amplitude.
创建时间：
2025-01-30
