XRD raw data
收藏DataONE2015-06-04 更新2024-06-27 收录
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资源简介：
XRD 2theta (degrees) vs. arbitrary intensity data for the ZnSiHA samples that were mixture of HA+aTCP (Table 1), and higher resolution scans of phase pure HA and substituted HA that were used in Rietveld refinement of the lattice parameters.
创建时间：
2015-06-04
