XRD raw data

XRD 2theta (degrees) vs. arbitrary intensity data for the ZnSiHA samples that were mixture of HA+aTCP (Table 1), and higher resolution scans of phase pure HA and substituted HA that were used in Rietveld refinement of the lattice parameters.

本数据集包含两类X射线衍射（X-ray Diffraction, XRD）数据：其一为羟基磷灰石（Hydroxyapatite, HA）与无定形磷酸三钙（amorphous Tricalcium Phosphate, aTCP）混合物制备的ZnSiHA样品的2θ角（单位：度）与任意强度的对应关系数据，详细信息见表1；其二为用于晶格参数里特维尔德（Rietveld）精修的纯相羟基磷灰石与掺杂羟基磷灰石的高分辨XRD扫描数据。