Data: Reaction products of F atoms on the surface of silicon dioxide probed by synchrotron photoionization mass spectrometry (Journal of Chinese Mass Spectrometry Society, 41, 39, 2020)
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This article presents the data of the published paper: Reaction products of F atoms on the surface of silicon dioxide probed by synchrotron photoionization mass spectrometry (Journal of Chinese Mass Spectrometry Society, 41, 39, 2020).
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Xiaofeng Tang创建时间:
2022-09-08



