Data: Microstructure Evolution of a VMnFeCoNi High-Entropy Alloy After Synthesis, Swaging and Annealing

This data set contains the raw data of the article "Microstructure Evolution of a VMnFeCoNi High-Entropy Alloy After Synthesis, Swaging, and Annealing" (https://doi.org/10.1002/adem.202503162). Each folder contains files related to the corresponding figures of the main article. They can be divided into the following types of data:
(1) Photos: "Figure 01" contains photographic images of the vacuum induction melter and the different stages of alloy processing.
(2) Microstructural data: Folders related to Figures 02, 03, 04, 06, 07, 08, 09, A1, A2, A3, and A4 contain backscattered electron (BSE) micrographs. Moreover, in some cases, the BSE images were segmented to identify oxides and σ-phase particles, which appeared either white or red on a black background in the main article, see folders "Figure 02" and "Figure 06". Folders "Figures 09" and "Figure A4" contain additional BSE micrographs used to estimate grain and crystallite sizes. Furthermore, subfolders labelled "Sigma segmentation" are present in these folders, which contain high-magnification BSE images used to segment and estimate the σ-phase fraction in the corresponding states.
(3) Energy-dispersive X-ray spectroscopy (EDS) data: The folder related to Figure 04 contains color-coded elemental distribution maps of V, Mn, Fe, Co, and Ni in the as-cast and homogenized states. The folders associated with Figures A1 and A2 contain representative spectra of a σ particle and an oxide, respectively.
(4) Quantitative data: Folders related to Figures 03, 05, 10, 11, A5-A7 contain ".dat files" with the quantitative data that were presented as tables or plotted as graphs in the main article. Folders "Figure 03" and "Figure 05" show data related to the chemical composition of the alloy as well as the different phases in the alloy. Folders "Figure 10", "Figure 11", and "Figure A5-A7" contain the same data related to crystallite/grain size of different states, their hardness values, and associated errors and derived parameters.