X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
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https://b2find.eudat.eu/dataset/e1b0fedc-f856-55ce-8e03-0e3d64d6a200
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XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis...
