X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzburg Domkapitel / Hochstift Würzburg charters

Name: X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzburg Domkapitel / Hochstift Würzburg charters
Creator: Universität Hamburg
Published: 2025-01-20 09:46:11
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DataCite Commons2025-01-20 更新2025-04-16 收录

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https://www.fdr.uni-hamburg.de/record/11177

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资源简介：

XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel and Hochstift Würzburg charters kept at the Staatsarchiv Würzburg (9th-12th century CE). Messpunkte Würzburg, Gruppen etc.docx - list of spots analysed (in German) Protocols_Würzburg_1.pptx - Protocol (part 1/4) Protocols_Würzburg_2.pptx - Protocol (part 2/4) Protocols_Würzburg_3.pptx - Protocol (part 3/4) Protocols_Würzburg_4.pptx - Protocol (part 4/4) Report_UrkundenWürzburg.docx - detailed report Würzburg charters_reflectography.zip - complete reflectography dataset Würzburg charters_XRF.zip - complete XRF dataset

提供机构：

Universität Hamburg

创建时间：

2022-12-09