SEM analysis of the TiO2 layers deposited on a FTO substrates
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Titanium dioxide layers were deposited on a FTO conducting glass by sol-gel method. For sol gel synthesis butoxy titanium and ethanol were used as a reagents. Samples were sintered in a furnace at temperature of 600 deg. SEM measurements were performed by FEI Quanta FEG250 microscope. SEM images of a cross-section of samples exhibit a porous structures of titanium dioxide layers. On the basis og SEM images the thickness of film was calculated.
提供机构：
Marcin Stanisław Łapiński
