SBF-SEM Dataset of "Breaking Free from the Acquisition Dogma for Volume Electron Microscopy"

This dataset contains the raw volume electron microscopy (VEM) data used for the experiments presented in Figure 2 and Figure 3 of our manuscript, "Breaking Free from the Acquisition Dogma for Volume Electron Microscopy". The data supports our findings on supervised and self-supervised denoising strategies for accelerating VEM acquisition. All data was acquired from a mouse brain tissue sample using a Serial Block-Face Scanning Electron Microscope (SBF-SEM). XY pixel size for all tiff stacks is 15 nm. This repository is organized into two main parts corresponding to the figures in the paper: 1. Supervised Denoising SBEM2-Z50-fast.tif: A 3D TIFF stack of the snapshot stack. This volume was acquired with 0.5us pixel dwell time and a 50 nm section thickness. SBEM2-Z50-slow.tif: A 3D TIFF stack of the reference stack. This volume was acquired with 2us pixel dwell time and a 50 nm section thickness. 2. Self-Supervised Denoising on Ultra-Thin Sections SBEM3-Z20-300.tif, SBEM3-Z25-300.tif, SBEM3-Z50-300.tif: 3D TIFF stacks with acquired with 20 nm, 25nm and 50nm section thickness, respectively. Each stack contains about 300 slices. These stacks serves as the input for our self-supervised denoising model.