Dataset: The perils and pitfalls of block design for EEG classification experiments
收藏IEEE2020-11-24 更新2026-04-17 收录
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https://ieee-dataport.org/open-access/dataset-perils-and-pitfalls-block-design-eeg-classification-experiments
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资源简介：
Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine IntelligenceThe perils and pitfalls of block design for EEG classification experimentsDOI: 10.1109/TPAMI.2020.2973153 If you use this code or data, please cite the above paper.
提供机构：
Wilbur, Ronnie B.; Ilyevsky, Thomas V.; Siskind, Jeffrey Mark; Bharadwaj, Hari M.; Li, Ren; Johansen, Jared S.; Ahmed, Hamad
创建时间：
2020-11-24
