Dataset: The perils and pitfalls of block design for EEG classification experiments

Name: Dataset: The perils and pitfalls of block design for EEG classification experiments
Creator: Wilbur, Ronnie B.; Ilyevsky, Thomas V.; Siskind, Jeffrey Mark; Bharadwaj, Hari M.; Li, Ren; Johansen, Jared S.; Ahmed, Hamad
Published: 2020-11-24T00:00:00+08:00

IEEE2020-11-24 更新2026-04-17 收录

脑电图分类

实验设计方法

数据链接：

https://ieee-dataport.org/open-access/dataset-perils-and-pitfalls-block-design-eeg-classification-experiments 数据链接链接失效反馈

官方服务：

资源简介：

Dataset asscociated with a paper in IEEE Transactions on Pattern Analysis and Machine IntelligenceThe perils and pitfalls of block design for EEG classification experimentsDOI: 10.1109/TPAMI.2020.2973153 If you use this code or data, please cite the above paper.

提供机构：

Wilbur, Ronnie B.; Ilyevsky, Thomas V.; Siskind, Jeffrey Mark; Bharadwaj, Hari M.; Li, Ren; Johansen, Jared S.; Ahmed, Hamad

创建时间：

2020-11-24