SEM micrographs of NH4VO3 crystals - molar concetration factor after annealing
收藏Mendeley Data2024-01-31 更新2024-06-29 收录
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The DataSet contains the scanning electron microscopy (SEM) micrographs of NH4VO3 nano_crystals obtained by the LPE-IonEx method with different morphology after annealing at 400C under argon atmosphere (with a heating rate of 10 C/min). The surface morphologies of the samples were studied by an FEI Company Quanta FEG 250 scanning electron microscope (SEM) (Waltham, MA, USA), mounting the analyzed sample on a carbon conductive tape. These results are part of the project reported in Materials journal (10.3390/ma12203446), in this paper synthesis details are defined.
创建时间：
2024-01-31
