Jupyter notebook code and example file for the evaluation of XRR data via FFT
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https://opara.zih.tu-dresden.de/xmlui/handle/123456789/1804
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资源简介：
This is supplementary information to the publication: "Fast fourier transform and multi-Gaussian fitting of XRR data to determine the thickness of ALD grown thin films within the initial growth regime"
提供机构：
Technische Universität Dresden
创建时间：
2020-11-14
