Microscopic defect dynamics during a brittle-to-ductile transition
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Description of Data employed in “<em>Microscopic defect dynamics during a brittle-to-ductile transition</em>”- The data reported in Table S.1 of PNAS paper is as follows : All raw data [mechanical synchronized with ultrasonic probes ] are in .mat files. The data includes both strain, stress, P-velocityand waveforms of passive sensor in the point of strain-stress also are provided . All data are in 2ns time-resolution – AE_CAT_xxx includes all information recorded during test in Paterson rig. The data are synchronized with pulsing (active) and passive excitations based on simple off-line synchronized matching ; The index the AE_CAT_xxx table doe have a corresponding waveforms due to an AE in M_xxx UM_XXX are based on table S1 and does have full strain-stress data set. Dist_xx_yy is distance measurement calculated based on DTW algorithm between each pair of tests Feel free to request [ hoghaff@mit.edu or mpec@mit.edu] further information regarding our methods of analysis the data or obtaining the waves in Paterson rig. **Apart of the presented data in the paper , we repeated each test at least twice to be confident about our results in particular ultra-high frequency AEs and the strain-stress history. Feel free to request data independently from corresponding authors.
