measurements
收藏DataCite Commons2024-11-12 更新2025-04-15 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-1960111965
下载链接
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资源简介：
in the framework of the MIAM project we will test some automatic mesh measurements to fix the setup and the time scale for such experiments. Sample are Si 4 inches wafers with sputtered layer on top. The deposit of the layer had been done at the N'eel institute.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2024-11-12
