Cypress Semiconductor High-Energy Neutron Evaluation
收藏B2FIND2026-04-25 收录
下载链接：
https://b2find.eudat.eu/dataset/95df2029-0129-5284-b437-8ba9ca13f546
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资源简介：
1) Neutron testing of NVM 65nm FL-L products. These flash memories will be programmed and exposed to neutrons to count the number of bit flips.2) Neutron testing of NVM 65nm...
