Grazing Incidence X-ray Scattering for Enhanced Solar Energy Harvesting

Here, grazing incidence X-ray scattering (GIXS) will provide new insights into the molecular self-assembly of small molecule organic semiconductor (OSC) and colloidal quantum dot (QD) films for emerging energy harvesting technologies. The proposed experiments involve both ex-situ and in-situ GIXS to expand our understanding of the relationships between materials processing <> film morphology <> optoelectronic performance. Time on XMaS is requested to enable real-time, high-resolution characterisation of the thin film molecular assembly during and after processing, paving the way for the rational design of processing routes to obtain targeted morphologies.