X-ray diffraction characterisation of strain engineering of single crystal si...

In this experiment, we aim to measure the strain at the micro-scale in novel silicon micro-/nano-structures for (opto-)electronic applications. We propose to use X-ray Laue...本实验旨在针对（光）电子应用场景，对新型硅基微纳结构的微尺度应变进行测量。我们拟采用X射线劳厄（X-ray Laue）……