Revealing grain boundary plane and curvature of nanostructured metals in three-dimensional 2 space with sub-nanometer resolution

The structure of grain boundaries plays a crucial role in determining the properties of polycrystalline metals
with extremely fine grains. Electron tomography has emerged as one of the most promising techniques for
characterizing grain boundaries, overcoming the dimensional and resolution limitations of conventional
methods, and achieving nanometer-scale resolution in three-dimensional space. Here we report an electron
tomography method that reconstructs the morphology and orientation of nanograins using dark-field images.
This approach enables spatial resolution for characterizing grain boundaries, reaching down to 0.3 nm. We
validate our approach on nano fivefold twinned nickel and nanostructured platinum, demonstrating its
capability for detailed analysis of grain boundary planes and curvatures in bulk nanocrystalline metals, even
those with extremely fine grains. Our dark-field electron tomography method opens new avenues for the
quantitative three-dimensional characterization of extremely fine grains in materials science.

晶界结构对超细晶粒多晶金属的性能具有至关重要的影响。电子断层扫描（Electron Tomography）已成为表征晶界最具潜力的技术之一，该技术克服了传统方法在维度与分辨率上的局限，可在三维空间中实现纳米级分辨率。本研究提出了一种基于暗场图像（dark-field images）重构纳米晶粒形貌与取向的电子断层扫描方法。该方法可实现晶界表征所需的空间分辨率，最低可达0.3 nm。我们在纳米五重孪晶镍与纳米结构铂上验证了该方法的有效性，证明其可对块体纳米晶金属（即使是超细晶粒材料）的晶界平面与曲率开展精细分析。我们提出的暗场电子断层扫描方法，为材料科学领域中超细晶粒的定量三维表征开辟了全新路径。

搜集汇总

背景与挑战

背景概述

该数据集聚焦材料科学领域，提供关于纳米结构金属中晶界平面和曲率的三维表征数据，基于电子断层扫描技术实现亚纳米级分辨率（达0.3纳米），并包含开放获取的论文和相关文件，数据量约499.59 MB。