OTS SAMs
收藏Mendeley Data2026-04-18 收录
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https://data.mendeley.com/datasets/6mb8jhcwz2
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资源简介：
AFM image of compact OTS SAM on bare silicon substrate showing the OTS film thickness and height histograms of smooth OTS film surfaces used to determine the OTS RMS roughness
创建时间：
2021-04-29
