Luminescence of TeO2:Eu thin films
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资源简介：
Tellurium dioxide doped by europium thin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. Morphology of the samples was observed by atomic force microscope. Doping by europium didn’t change structural parameters. Optical measurements showed photoluminescence from both Eu2+ and Eu3+ ions.
提供机构：
Marcin Stanisław Łapiński
