Characterization and reaction condition data of Ru/CeOx catalyst for preparation of cyclohexanol from phenol

The phase structure of the prepared catalyst was analyzed by UltimaIV X-ray diffractometer equipped with Cu Kα radiation (Nippon Nikko Co., Ltd.). The powder XRD spectrum of the catalyst sample was measured in the range of 2θ from 5 to 80, and the scanning rate was 10° /min. PhenomLE scanning electron microscope (Japan Electronics Co., Ltd.) and JEM-2100 UHR high resolution transmission electron microscope (Japan Electronics Co., Ltd.) were used to characterize the morphology of the catalyst. The chemical state of elements on the catalyst was determined by AXISUltraDLD X-ray photoelectron spectrometer (Shimadzu) equipped with Al Kα X-ray anode source. The peak of XPS spectrum is corrected by the binding energy of C1s(284.6 eV). The oxygen vacancy was determined by DXR532 laser Raman spectrometer (Thermo Fisher Scientific Company, USA) equipped with a 532nm laser system.The hydrogenation performance of the catalyst for phenol was tested in a 50 mL stainless steel autoclave equipped with magnetic stirring. The catalyst (0.05 g), isopropanol (5 g), deionized water (20 g) and phenol (1 g) were put into the autoclave for each operation, stirred at 800 rpm, and heated to the required temperature.