Test of Neutron Effects On Commercial Off The Shelf FPGA
收藏B2FIND2026-04-25 收录
官方服务：
资源简介：
The goal of these joint ChipIR/VESUVIO proposed experiments is to characterize the SEU occurrence on new generation FPGA caused by neutrons. We will focus on a Commercial...
本次由ChipIR与VESUVIO联合提出的实验，旨在刻画新一代现场可编程门阵列（Field-Programmable Gate Array, FPGA）受中子引发的单粒子翻转（Single Event Upset, SEU）的发生特性。本次实验将聚焦于商用……
