X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaatsarchiv (München) Emmeran charters
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https://www.fdr.uni-hamburg.de/record/11172
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资源简介：
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (München) (9th-12th century CE).
Emmeran charters_reflectography.zip - complete reflectography dataset
Emmeran charters_XRF.zip - complete XRF dataset
Messpunkte Emmeram.docx - list of spots analysed (in German)
Protocols Emmeran.pptx - Protocol (part 1/2)
Protocols Emmeran 2.pptx - Protocol (part 2/2)
Report_Emmeran Charters.docx - detailed report
提供机构：
Universität Hamburg
创建时间：
2022-12-09
