X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaatsarchiv (München) Emmeran charters

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran charters kept at the Bayerisches Hauptstaatsarchiv (München) (9th-12th century CE). Emmeran charters_reflectography.zip - complete reflectography dataset Emmeran charters_XRF.zip - complete XRF dataset Messpunkte Emmeram.docx - list of spots analysed (in German) Protocols Emmeran.pptx - Protocol (part 1/2) Protocols Emmeran 2.pptx - Protocol (part 2/2) Report_Emmeran Charters.docx - detailed report