X-ray Raman scattering and X-ray diffraction of nitrogen up to 150 GPa
收藏ESRF Portal2027-01-01 更新2026-04-23 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-1901513211
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资源简介：
To explore the behavior of nitrogen under extreme pressures, we utilize non-resonant inelastic X-ray Raman scattering capabilities available at ID20 beamline (ESRF). With this study we aim to extend our understanding of the structural phase transitions and electronic properties of nitrogen. The prototypical diatomic molecule nitrogen shows an impressive polymorphism. Under pressure, delta-N2 undergoes several structural transitions to epsilon-, zeta- and amorphous black eta-N2 at room temperature. Our approach involves two complementary techniques - X-ray Raman scattering (XRS) and X-ray diffraction (XRD). XRS allows us to study the changes in electronic structure associated with the pressure-induced transformations in nitrogen. At the same time, XRD measurements will be used to monitor the structural changes in conjunction with subsequent AIMD simulations. We anticipate that this study will provide unique insights for materials and planetary science.
提供机构：
Institute of Glass and Glass Technology, IV, Leipziger Str. 28, 09599 Freiberg, Germany; Technical University Bergakademie Freiberg, Institute of Glass Science and Technology, Leipziger Strasse 28, 09599 Freiberg, Germany; University of Turku, Department of Physics, Vesilinnantie 5, 20014 Turku, Finland; TU Dortmund, Experimentelle Physik I, Otto Hahn Strasse 4, 44227 Dortmund, Germany; Technische Universitaet Dortmund, DELTA, Fakultät Physik, Maria-goeppert-mayer Strasse 2, 44221 Dortmund, Germany
创建时间：
2027-01-01
