Effects of clonal patch area of Leymus chinensis on the slopes and intercepts of reproductive allometric relationships at two levels.

Note: Using regression SMA analyses, allometric slopes and intercepts were obtained from the log–log linear relationship described as log10Y = Slope×log10X+Intercept. R2 values indicate the extent to which the results can be explained by the models. “-” suggests that at P = 0.05 the relationship is not significant. Bold allometric slopes represent that they are significantly different from 1 at P = 0.05. Values in the same row sharing the same letter(s) are not significantly different at P = 0.05.Effects of clonal patch area of Leymus chinensis on the slopes and intercepts of reproductive allometric relationships at two levels.