Cell-wise grain-boundary stress and descriptor dataset for "Microstructural Drivers of Stress Localization in Elastic Polycrystals"

Processed cell-wise stress and microstructural-descriptor dataset underpinning the full-field uncertainty-quantification study of stress localization in elastic copper polycrystals. The ensemble is 50 Voronoi grain morphologies × 512 crystallographic-orientation realizations = 25,600 linear-elastic finite-element simulations on a fixed 32×128×32 hexahedral mesh (element size 3.125 µm, uniaxial tension), computed with the finite-element library M++.▎One row per grain-boundary mesh cell per simulation (588,255,744 rows) in 50 Apache Parquet files, one per morphology: von Mises and axial stress, the grain-boundary stress concentration factor, host-grain interior reference stresses, six a-priori and response-informed microstructural descriptors (axial stiffness/stress contrast, host-grain Schmid factor, junction indicator, misorientation angle, boundary-plane alignment), and absolute/SCF hotspot indicators at five quantile levels. Two companion tables give the input Euler angles per grain and the centroid coordinates and structured grid indices of every mesh cell. Every column is cross-referenced to its defining equation in the manuscript in the included README.md.