Dataset for 'Surface-Tension-Induced Phase Transitions in Freestanding Ferroelectric Thin Films'

The control of ferroelectric topological phases in ultrathin films is central to the development of next-generation nanoelectronic devices. While epitaxial strain is widely used to tune polarization states, its applicability is inherently limited to substrate-bound systems. Here, we show that surface tension becomes a key mechanical factor in freestanding ferroelectric films, governing phase stability and the emergence of topological polarization textures. Using a thermodynamic free energy framework, we show that surface tension induces effective compressive stress in freestanding films, strongly influencing both uniform and topological polarization states. Surface tension also drives large-scale morphological instabilities, reshaping phase behavior in the ferroelectric regime. Our results reveal surface tension as a robust, substrate-independent mechanism for engineering polarization states in freestanding films, creating new opportunities for flexible, strain-free ferroelectric devices. This Zenodo record provides part of the data used in the article, including the numerical results and datasets supporting the phase diagrams and polarization configurations discussed in the publication. These data enable reproducibility and further analysis of surface-tension-induced phase transitions in freestanding ferroelectric thin films.