Depth XPS profile of Fe-S layers on a titanium substrate
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资源简介:
Depth XPS profile of Fe-S layers on a titanium substrate was measured. Material was etched by Argon ion gun and measured by XPS method. For each sample, three times per 10 minutes each was sputtered.
提供机构:
Gdańsk University of Technology
创建时间:
2021-06-23



