Direct quantification of topological protection in symmetry-protected photonic edge states at telecom wavelengths

The dataset comprises the figures for the paper "Direct quantification of topological protection in symmetry-protected photonic edge states at telecom wavelengths" by Sonakshi Arora, et. al.. The research objective is the quantification of robustness in topologically non-trivial photonic crystals by means of a phase resolving near field microscope. We map the electric fields in such a crystal and look at reflection and transmissions coefficients through two crystal designs: a straight domain wall and a trapezoidal shaped defect.

本数据集收录了索纳克什·阿罗拉（Sonakshi Arora）等人发表的论文《电信波长（telecom wavelengths）下对称保护光子边缘态（symmetry-protected photonic edge states）中拓扑保护（topological protection）的直接量化》中的相关图表数据。本研究的目标为借助相分辨近场显微镜（phase resolving near field microscope），对非平凡拓扑光子晶体（topologically non-trivial photonic crystals）的鲁棒性开展量化分析。我们对该类晶体中的电场分布进行成像测绘，并针对两种晶体构型——直畴壁（straight domain wall）与梯形缺陷（trapezoidal shaped defect）结构的反射与透射系数展开研究。