Supplementary data for: K-edge XANES characterization of ultra-thin (V₁₋ₓCrx)₂O₃ films and binary vanadium oxide compounds
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https://zenodo.org/record/10450562
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资源简介：
This contains X-ray absorption and diffraction data collected at the Swiss Light Source for various vanadium/chromium oxide samples.
Supplement to our paper titled: "K-edge XANES characterization of ultra-thin (V1-xCrx)2O3 films and binary vanadium oxide compounds"
The file "xanes_sample_table.csv" contains the sample metadata for the respective directories.
创建时间：
2024-01-04
