Inclusion SEM BSE images of 4 final product plate samples
收藏Figshare2023-02-03 更新2026-04-28 收录
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资源简介：
Inclusion backscattered electron images generated from SEM analysis, compiled from 4 final product samples. SEM analysis was carried out at 20 kV accelerating voltage using the Automated Steel Cleanliness Analysis Tool (ASCAT), at the RJ Lee Group facility. Each folder contains inclusion images from one sample, corresponding to one of the four samples. The inclusion data obtained from the SEM analysis for these images can be found in: Abdulsalam, Mohammad; Webler, Bryan (2021): Inclusion SEM analysis of 4 final plate product samples. Carnegie Mellon University. Dataset. https://doi.org/10.1184/R1/14755092.v1
创建时间：
2023-02-03
