Spectroscopic ellipsometry mapping of PAAO (AJ-2-04-20 sample)
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https://zenodo.org/record/5718201
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资源简介：
Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 37 seconds.
The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-2-04-20 Ellipsometry Mapping Measurements.rar" file.
Ellipsometer: rotating compensator GES5-E (Semilab).
Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.
Detector: UV-Vis CCD with 0.8 nm resolution.
Spectral range: approximately 230-960 nm.
Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.
Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence).
The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7059828
创建时间：
2023-06-30
