Complex Refractive Index of Indium Tin Oxide Thin Films obtained by Variable Angle Spectroscopic Ellipsometry
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https://zenodo.org/record/10790101
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资源简介：
The two uploaded datasets are published in the following article:
Minenkov, Hollweger, Duchoslav, Erdene-Ochir, Weise, Ermilova, Hertwig, Schiek.Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy.ACS Appl. Mater Interfaces 16 (2024) 9517.
https://doi.org/10.1021/acsami.3c17923
Dataset "NK ITO layer XY5S.txt" contains the complex refractive index of an ITO layer on glass type XY15S purchased from Xinyan Technology LTD.
Dataset "NK graded ITO layer.txt" contains the complex refractive index of a sputtercoated, graded ITO layer on a SiO2-Si-wafer.
创建时间：
2024-03-07
