XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
收藏Mendeley Data2024-01-31 更新2024-06-28 收录
下载链接：
https://mostwiedzy.pl/en/open-research-data/xrd-patterns-of-vanadium-oxide-nanostructures-on-silicon-substrate-obtained-by-v2o5-recrystallization,619125442642323-0
下载链接
链接失效反馈官方服务：
资源简介：
The DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. X-ray diffraction patterns (XRD) were collected on a Philips X’PERT PLUS diffractometer with Cu Ka radiation (1.5406 Å) and ranging from 10 to 80 degrees.
创建时间：
2024-01-31
