Dielectric material, KTN, under electric field measured by diffuse x-ray scat...

We propose to study dielectric materials with an in-situ methodology that will use an applied voltage measuring diffuse scattering. In particular, our idea is to study an...本研究提出采用一种结合施加电压漫散射测量的原位（in-situ）方法，开展介电材料的相关研究。具体而言，本研究拟研究……