X-Ray Reflectivity of chips for quantum application

We will be measuring X-ray reflectivity of various samples that have quantum applications. These sample consist of stacked films with different thickness on Si substrate. We...我们将对各类具备量子应用价值的样品开展X射线反射率（X-ray reflectivity）测试。此类样品均为硅（Si）衬底上沉积的不同厚度堆叠薄膜。我们...