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Continuous Pulse Test Waveform for Current Sharing of Paralleled SiC MOSFETs

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IEEE2026-04-17 收录
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https://ieee-dataport.org/documents/continuous-pulse-test-waveform-current-sharing-paralleled-sic-mosfets
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The supplementary file includes the experimental waveform which we recorded in the continuous operating test. It shows the dynamic response of the close-loop control. From the waveform, both the static and dynamic current are not matched at the beginning. The DSP measures the errors and the Vcc is changed by adjusting the duty cycle of the buck converter. The transient current is matched via adjusting the lagging time between the gate signals. After a couple of cycles, the current become balanced.
提供机构:
Du, Liyang; Du, Xia; Mantooth, Alan; Zhao, Shuang
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