In order to accurately measure non-uniform noise, it is necessary to suppress the influence of experimental environment errors and other noise sources in the imaging system. We conducted imaging exper
This dataset contains cryogenic Id-Vd and Id-Vg data with different Vds for N- and P-MOSFET (W/L = 10 μm/1μm) from 300 K to 4 K. A Keysight B1500A semiconductor analyzer attached to a pulse tube
In order to accurately measure non-uniform noise, it is necessary to suppress the influence of experimental environment errors and other noise sources in the imaging system. We conducted imaging exper