Performance Comparison of Er³⁺-Based MOSLED Devices Fabricated by ALD
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https://orkg.org/comparison/R1469991
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资源简介：
Comparison of Er³⁺-doped MOSLEDs with different host matrices fabricated by atomic layer deposition, evaluating annealing temperature, quantum and power efficiency, threshold voltage, emission lifetime, and operational stability.
提供机构：
Open Research Knowledge Graph
创建时间：
2025-09-08
