Interior Crisis Route to Extreme Events in a Memristor-Based 3D Jerk System

These are experimental time series for an electronic model of extreme event generation. They are provided to support the replication of the results reported in the associated publication, as well as any further public-domain academic research in the field of neural dynamics, nonlinear electronic circuits, and related aspects, in compliance with the specified license terms and all applicable legal clauses.

The following reference must be cited when using these data:Vivekanandan G, Kengne LK, Chandrasekhar D, Fozin TF, Minati L. Interior Crisis Route to Extreme Events in a Memristor-Based 3D Jerk System. International Journal of Bifurcation and Chaos, epub ahead of print 2024, DOI https://doi.org/10.1142/S021812742450161X 

L.M. gratefully acknowledges the support of the “Hundred Talents” program of the University of Electronic Science and Technology of China, the “Outstanding Young Talents Program (Overseas)” program of the National Natural Science Foundation of China, and the talent programs of the Sichuan province and Chengdu municipality. G.V. and D.C. were supported by the Center for Nonlinear Systems, Chennai Institute of Technology (CIT), India vide funding number CIT/CNS/2021/RD/022.