X-Ray Fluorescence and Reflectography Data from Cambridge, Wren Library Ms B1...

XRF (Elio: 40kV, 100 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on...本数据集涵盖X射线荧光光谱法（XRF）测量数据与反射成像数据：其中XRF测量使用Elio设备，参数设置为40千伏、100微安，每个点位的测量时长为120秒；反射成像采用DinoLite设备，针对墨迹与颜料点位采用50倍放大倍率，针对……点位则采用200倍放大倍率。