Tracking the Topotactic-Phase-Transition in SrCoOx Thin Film via In-Operando Electric Field-Dependent PES & XAS

The topotactic phase transition (TPT) through electric biasing is an effective knob to tune electronic properties in oxide thin films owing to their tremendous prospects in the Mottronic applications, still scarcely explored. Here we propose to spectroscopically characterize the electronic property of the TPT-material SrCoOx thin film, by recording the Co 3p-3d or 2p-3d resonant photoemission spectroscopy (RPES) and O K-edge x-ray absorption spectroscopy (XAS) of the system under in-operando electric field application.