X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale de France, Ms Fr9084
收藏University of Hamburg2020-07-13 更新2026-04-17 收录
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https://www.fdr.uni-hamburg.de/record/1209
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资源简介:
XRF (Elio: 40kV, 20 µA, spot measurements of 30-60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of pigments from miniatures of BNF Ms Fr9084 from the Bibliothèque nationale de France (France). Analysis of 8 folios BNF Français 9084_report.docx - report in French French9084.pptx - protocol and results Reflectography_BNF_French9084.zip - complete reflectography Dataset XRF_BNF_French9084.zip - complete XRF Dataset MSI was also performed to recover damaged writing. Link to dataset is included in related identifier.
提供机构:
Rabin, Ira; Shevchuk, Ivan; Bonnerot, Olivier
创建时间:
2020-07-13



