Supplemental materials

The XRD spectrum and optical photograph of sample (Fig. S1). The detail of the electrical measurement (Fig.S2). The analysis of the anisotropic magnetoresistance (Fig. S3). The fast Fourier transformation of the AMR with various magnetic field applied at different temperatures (Fig. S4). The angular dependence of the planar Hall effect and the fitted results (Fig. S5) and the field dependence of the magnetoresistance in Mn2.4Ga for magnetic field applied parallel to current and perpendicular to the current (Fig. S6).