Neutron Reflectometry of Tethered Microphase Separated Block Copolymers
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Neutron reflectometry will be used to probe the scattering length density profile in tethered films of block copolymers grafted onto silicon substrates. The tethered...
本研究将采用中子反射法(Neutron Reflectometry),表征接枝于硅基底(silicon substrate)上的嵌段共聚物(block copolymer)接枝薄膜(tethered film)内的散射长度密度剖面(scattering length density profile)。该接枝……



