Structure and Thermoelectric Characterization of A<i><sub>x</sub></i>Ba<sub>8</sub><sub>-</sub><i><sub>x</sub></i>Al<sub>14</sub>Si<sub>31</sub> (A = Sr, Eu) Single Crystals
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Single crystals of AxBa8-xAl14Si31 (A = Sr, Eu) were grown using a molten Al flux technique. Single-crystal X-ray diffraction confirms that AxBa8-xAl14Si31 (A = Sr, Eu) crystallize with the type I clathrate structure, and phase purity was determined with powder X-ray diffraction. Stoichiometry was determined to be Sr0.7Ba7.3Al14Si31 and Eu0.3Ba7.7Al14Si31 by electron microprobe analysis. These AxBa8-xAl14Si31 phases can be described as framework-deficient clathrate type I structures with the general formula, AxBa8-xAlySi42-3y/4[]4-1/4y. DSC measurements indicate that these phases melt congruently at 1413 and 1415 K for Sr0.7Ba7.3Al14Si31 and Eu0.3Ba7.7Al14Si31, respectively. Temperature-dependent resistivity indicates metallic behavior, and the negative Seebeck coefficient indicates transport processes dominated by electrons as carriers. Thermal conductivity of these phases remains low with Sr0.7Ba7.3Al14Si31 having the lowest values.
